DIN 51399-2 Testing of Lubricants - Determination of Elemental Content in Additives, Wear and Other Contaminants - Part 2: Wavelength Dispersive X-Ray Fluorescence Spectrometry (XRF)

The standard "DIN 51399-2 Testing of lubricants - Determination of elemental content in additives, wear and other contaminants - Part 2: Wavelength-dispersive X-ray fluorescence spectrometry (XRF)" developed by the German Institute for Standardization (DIN) describes a test method for determining the elemental content in lubricating oils that may originate from additive content, wear or foreign matter. Wavelength-dispersive X-ray fluorescence spectrometry (XRF) is used in these tests.

Wavelength dispersive X-ray fluorescence spectrometry (WDXRF) is a non-destructive technique. It is well known for determining the inorganic components of samples. However, X-ray scattering region spectral data is not widely used, although it can provide information about organic components and their interactions. Wavelength dispersive X-ray fluorescence is one of two general types of X-ray fluorescence instrumentation used for elemental analysis applications. In wavelength dispersive X-ray fluorescence spectrometers, all elements in the sample are excited simultaneously.

The different energies of the characteristic radiation emitted from the sample are diffracted in different directions by an analyzing crystal or monochromator (similar to the effect of a prism dispersing visible light of different colors in different directions). By placing the detector at a certain angle, the intensity of X-rays of a particular wavelength can be measured. Sequential spectrometers use a detector that moves on a goniometer to measure the intensities of many different wavelengths over an angular range. Simultaneous spectrometers are equipped with a series of fixed detection systems, each system measuring the radiation of a particular element. The main advantages of wavelength-dispersive X-ray fluorescence systems are high resolution and minimal spectral overlap.

X-ray optics can be used to enhance wavelength dispersive X-ray fluorescence instrumentation. For conventional XRF instrumentation, typical focal spot sizes at the sample surface range from a few hundred micrometers to a few millimeters in diameter.

Wavelength dispersive spectroscopy works on the principle of diffraction. When X-rays emitted from a sample enter wavelength dispersive spectroscopy, they hit a crystal with certain crystal lattice parameters. This causes the X-rays to diffraction (bend), and the amount by which the X-rays are bent depends on their energy.

Wavelength dispersive spectroscopy is a complementary technique to energy dispersive spectroscopy for performing x-ray analysis of materials to determine their elemental composition. Elemental analysis by energy dispersive spectroscopy suffers from several shortcomings, such as high background levels and relatively poor energy resolution. This results in poorer detection limits and an inability to separate elements with peaks of similar energy. Wavelength dispersive spectroscopy overcomes these limitations. It has much higher energy resolution, so closely spaced peaks can be easily separated, and has cleaner background levels, so detection limits are greatly improved over wavelength dispersive spectroscopy alone. This improves element quantification and identification.

Wavelength dispersive spectroscopy also has a much higher sensitivity to low atomic number elements and provides much better detection of low elements. As a result, it provides much higher confidence in the identification of the elements detected in any given analysis.

Our organization has a strong staff that closely follows the developments in science and technology in the world and constantly improves itself. Among the numerous test, measurement, analysis and evaluation studies provided for businesses in various sectors, there are also testing services in accordance with the standard “DIN 51399-2 Testing of lubricants - Determination of elemental content in additives, wear and other contaminants - Part 2: Wavelength dispersive X-ray fluorescence spectrometry (XRF)”.