Accelerated life test (ALT) is a test and analysis technique applied to determine how errors and malfunctions will occur in the future. This technique is a popular testing method because of its ability to speed up time. Generally, this test method is used where failures cannot be expected to occur at their normal rate, but how future failures may occur should be anticipated in advance.
For example, if the average lifespan of a tested component is 30 years, the manufacturer cannot reasonably wait several years to perform a reliability test before putting its products on the market. By increasing the stress on the component, the possible failure should be triggered faster. Done correctly, this test is equivalent to speeding up the passage of time. For example, an electronics manufacturer might collect failure data at various voltages, fit the appropriate life-stress model, and then enter usage stress into the life-stress model to determine the breakdown distribution that is expected to occur in use-stress.
The ALT accelerated life test is also a very useful method for determining the effectiveness of product depreciation. How much component life will be extended can be quantitatively measured using an ALT test to find the life stress pattern.
ALT tests can be administered single-stress or double-stress. In dual stress models, there are two stresses tested, such as temperature and humidity. The testing process is largely the same. The way the ALT test is performed depends on the stress profile. Two popular methods of performing ALT testing are: using a constant tension profile and using a step stress profile.
At a fixed stress profile, each component tested experiences only one stress level. In a step stress profile, each component starts with the lowest stress held for a period of time before escalating to higher levels. Fixed stress profiles are mathematically easier to fit and understand and therefore more popular. Step stress profiles are useful only when there are a limited number of components and it is not known at what stress to test them. Selecting a voltage that is too low may result in no malfunction.
Our organization also provides ALT accelerated life test services with its trained and expert staff and advanced technological equipment, among the numerous test, measurement, analysis and evaluation studies it provides for businesses in various sectors.
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