SMC-S-010 Technical Requirements for Electronic Components, Materials and Processes Used in Space Vehicles

“Published by the U.S. Air Force Space Command’s Space and Missile Systems Center (SMC),The standard SMC-S-010 Technical requirements for electronic components, materials, and processes used in space vehicles describes the minimum technical requirements for electronic components, materials, and processes used in the design, development, and manufacturing of space vehicles. This standard includes application information, design and construction information, and quality assurance provisions. All electronic components, materials, and processes selected for use in space vehicles must meet the requirements specified herein unless otherwise approved by the program. These requirements may be fulfilled by the contractor or subcontractors. However, the prime contractor is responsible for ensuring that all requirements are met.

This standard contains essential performance requirements for electronic components, materials and processes, and the quality and reliability assurance requirements that must be met for their acquisition. Detailed requirements, specific characteristics of electronic components, materials and processes, and other provisions sensitive to the particular intended use are specified in the device specification.

The quality assurance requirements outlined here are for all electronic components, materials and processes manufactured or performed on a production line controlled by a manufacturer's quality management system. Various levels of product assurance are provided in this specification, including radiation hardness assurance.

In the event of a conflict between the text of this standard and the references cited herein (excluding device specifications), the text of this standard shall take precedence. However, nothing in this standard supersedes any applicable law or regulation unless a specific exemption is obtained.

This standard is designed for use in the acquisition of space vehicles. This standard must be referenced in the contract statement and may be adapted by the acquisition activity for the specific application or program.

The implementation of the requirements of this standard and its changes or modifications are carried out in accordance with the "TOR-2006(8583)-5235 Parts, materials and processes control program for space vehicles", the provisions and authority of the electronic parts, materials and processes management and the requirements of the program.

The application requirements in this standard are specified as follows:

• Electrical rating. Circuits shall be designed and approved with parts rated as specified herein or at least an equivalent rating scheme that is technically justified by part stress analysis and worst case analysis and shall support and be approved for the required duty cycle. The degree to which electrical stress (e.g. voltage, current or power) is rated is temperature dependent. The general relationship between electrical stress and temperature is shown in the figure given in the standard. Approved flight operating conditions are in the area below the nominal limiting line. Worst case limits also apply to flight conditions.
• End of life. Circuits should be designed so that the required functional performance at the component level is maintained even if the performance values ​​of the parts used change within the end of life design limits specified by the program.
• Sensitivity to aging. Electronic, optical, and mechanical parts and materials are susceptible to aging when they experience a gradual shortening of their useful life or a gradual deterioration of their performance parameters. Aging mechanisms include:
  • Loss of hermeticity
  • Stress relaxation
  • Oxidation and corrosion
  • Gas release
  • Cold flow and creep
  • Molecular cross-linking
  • Loss of adhesion
  • Brittleness (including thermal) and hardening
  • Torque loss
  • Loss of spring tension
  • Moisture absorption
  • Radiation effects

Ageing sensitivity should be taken into account in the design, selection and application of parts and materials. In addition, ageing sensitivity should be included in mandatory plans for shelf life and ageing control. These plans should include minimum shelf life assurance requirements when parts and materials are supplied and any required re-verification or re-testing of parts and materials after shelf life has been exceeded. All parts and materials should meet the requirements of the TOR 2006(8583)-5235 standard for shelf life control.

• Sealed packages. Hermetically sealed parts are preferred for use in spacecraft. If non-hermetically sealed parts are selected, the in-process assembly and cleaning processes used shall not damage the parts and subsequent outgassing, sublimation, moisture penetration or moisture absorption shall not harm the part and its long-term performance or the system.
• Registered (questionable reliability) electronic parts, materials and processes and prohibited electronic parts, materials and processes. Detailed sections of this standard identify known registered electronic parts, materials and processes and prohibited electronic parts, materials and processes, including applications and supply restrictions.
• Handling. Protection against electrostatic damage to electrostatic sensitive devices is provided in accordance with this standard.
• Marking. Marking must be in accordance with applicable military specifications.
• Outgassing requirements. When required by the contamination control plan, all polymeric and organic materials shall be tested for outgassing in accordance with ASTM-E-595 and the results shall be documented in the approved design and construction materials list. As a guideline, materials shall exhibit not more than 1,0 percent total mass loss and not more than 0,1 percent collected volatile condensable material. Data listed in NASA reference publication 1124 or on the NASA website for “Outgassing Data for Selecting Spacecraft Materials Online” may be used for applicable materials in lieu of actual testing. Outgassing data shall correspond to a condition/cure cycle to be used.
• Alternative quality conformance inspection testing/sampling plan. The alternative quality conformance inspection testing/sampling plan for homogeneous batches as defined by the applicable MIL standard for microcircuits, discrete diodes, and transistors shall be in accordance with the annex of this standard (Annex C).

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