EN European Norm Tests Part 167

EN European Norm Tests Part 167

EN Standards are European Standards. These standards specify requirements for a particular item, material, component, system or service, or describe in detail a particular method or procedure, and tests are performed accordingly.

EN European Norm Tests Part 167

  • EN 129101: 1995; Compatible quality assessment system for electronic components. Blank detail specification: wire-wound surface mount inductors of evaluated quality. Evaluation level E.
  • EN 129102: 1995; Harmonized quality assessment system specification for electronic components. Blank detail specification: wire-wound surface mount inductors of evaluated quality. Evaluation level P.
  • EN 129200: 1996; Compatible quality assessment system for electronic components. Cross-sectional characteristics : Fixed inductors with ceramic or ferrite cores wound with copper wire for RF circuits.
  • EN 129201 : 1995 ; Harmonized quality assessment system specification for electronic components. Blank detail feature: wire-wound inductors with ceramic or ferrite cores. Evaluation level E.
  • EN 129202 : 1995 ; Harmonized quality assessment system specification for electronic components. Blank detail feature: wired inductors with ceramic or ferrite cores. Evaluation level P.
  • EN 130000 : 1994 ; Compatible quality assessment system for electronic components. General characteristics: fixed capacitors.
  • EN 130100: 1998; Compatible quality assessment system for electronic components. Cross-sectional characteristics: fixed polyethylene-terephthalate film dielectric metal foil capacitors for direct current.
  • EN 130101: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fixed polyethylene-terephthalate film dielectric metal foil capacitors for direct current. Evaluation level E.
  • EN 130102: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fixed polyethylene-terephthalate film dielectric metal foil capacitors for direct current. Evaluation level EZ.
  • EN 130200 : 1993 ; Compatible quality assessment system for electronic components. Cross-sectional characteristics: fixed tantalum capacitors with non-solid or solid electrolyte.
  • EN 130201: 1995; Harmonized quality assessment system specification for electronic components. Blank detail feature: fixed tantalum capacitors with solid electrolyte, porous anode (subfamily 3).
  • EN 130202: 1998; Compatible quality assessment system for electronic components. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte, porous anode (subfamily 2).
  • EN 130300: 1998; Compatible quality assessment system for electronic components. Cross-sectional characteristics: aluminum electrolytic capacitors with solid and non-solid electrolyte.
  • EN 130500: 1998; Compatible quality assessment system for electronic components. Cross-sectional characteristics: fixed metallized polycarbonate film dielectric capacitors for direct current.
  • EN 130501: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fixed metallized polycarbonate film dielectric capacitors for direct current. Evaluation level E.
  • EN 130502: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fixed metallized polycarbonate film dielectric capacitors for direct current. Evaluation level EZ.
  • EN 130800 : 2001 ; Compatible quality assessment system for electronic components. Section properties. Tantalum surface mount capacitors.
  • EN 130900: 1998; Compatible quality assessment system for electronic components. Cross-sectional characteristics: fixed polystyrene film dielectric metal foil dc capacitors.
  • EN 130901: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fixed polystyrene film dielectric metal foil dc capacitors. Evaluation level E.
  • EN 130902: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fixed polystyrene film dielectric metal foil dc capacitors. Evaluation level EZ.
  • EN 131700: 1998; Compatible quality assessment system for electronic components. Cross-sectional characteristics: Fixed capacitors for direct current with thin metal foil electrodes and a polycarbonate film dielectric.
  • EN 131701: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fixed capacitors for direct current with thin metal foil electrodes and a polycarbonate film dielectric. Evaluation level E.
  • EN 131702: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fixed capacitors for direct current with thin metal foil electrodes and a polycarbonate film dielectric. Evaluation level EZ.
  • EN 131800: 1998; Compatible quality assessment system for electronic components. Section characteristics: fixed polypropylene film dielectric metal foil dc capacitors.
  • EN 131801: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fixed polypropylene film dielectric metal foil dc capacitors. Evaluation level E.
  • EN 131802: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fixed polypropylene film dielectric metal foil dc capacitors. Evaluation level EZ.
  • EN 132100: 1997; Compatible quality assessment system for electronic components. Cross-sectional characteristics: fixed multilayer ceramic surface mount capacitors. Evaluation levels EZ and DZ.
  • EN 132101: 1993; Harmonized quality assessment system specification for electronic components. Empty detail property. Fixed multilayer ceramic chip capacitors.
  • EN 132101: 1997; Empty detail property. Fixed multilayer ceramic surface mount capacitors. Evaluation level EZ.
  • EN 132102: 1997; Empty detail property. Fixed multilayer ceramic surface mount capacitors. Evaluation level DZ.
  • EN 132400 : 1995 ; Compatible quality assessment system for electronic components. Section properties. Fixed capacitors (Rating Level D) for electromagnetic interference suppression and connection to the supply network.
  • EN 132401 : 1995 ; Harmonized quality assessment system specification for electronic components. Blank detail specification : Fixed capacitors for electromagnetic interference suppression and connection to mains. Evaluation level D.
  • EN 132421 : 1997 ; Compatible quality assessment system for electronic components. Blank detail feature: fixed capacitors for electromagnetic interference suppression. Capacitors for which safety tests are required (safety tests only).
  • EN 133000: 1997; Compatible quality assessment system for electronic components. General specification : passive filter units for electromagnetic interference suppression.
  • EN 133100: 1998; Compatible quality assessment system for electronic components. Sectional characteristics: passive filter units for electromagnetic interference suppression. Filters where security tests are not required.
  • EN 133101: 1998; Compatible quality assessment system for electronic components. Blank detail specification : Passive filter units for electromagnetic interference suppression. Filters where security tests are not required.
  • EN 133200 : 1995 ; Compatible quality assessment system for electronic components. Sectional characteristics: passive filter units for electromagnetic interference suppression (filters where safety tests are required).
  • EN 133200 : 1999 ; Compatible quality assessment system for electronic components. Sectional characteristics: passive filter units for electromagnetic interference suppression (filters where safety tests are required).
  • EN 133201: 1998; Compatible quality assessment system for electronic components. Blank detail feature: Passive filter units for electromagnetic interference suppression. Filters for which security tests are required.
  • EN 133221: 1998; Compatible quality assessment system for electronic components. Blank detail feature: Passive filter units for electromagnetic interference suppression. Filters where security tests are required (security tests only).
  • EN 134000: 1995; Compatible quality assessment system for electronic components. General features: variable capacitors. (Qualification confirmation and talent confirmation).
  • EN 134100: 1996; Compatible quality assessment system for electronic components. Cross-sectional characteristics: variable capacitors (Qualification approval).
  • EN 134101: 1995; Harmonized quality assessment system specification for electronic components. Blank detail feature: single-turn disc smoothing capacitors (qualification confirmation).
  • EN 134102: 1995; Harmonized quality assessment system specification for electronic components. Blank detail feature: multi-turn concentric capacitors (qualification confirmation).
  • EN 134103: 1995; Harmonized quality assessment system specification for electronic components. Blank detail feature: vane type air dielectric capacitors (qualification confirmation).
  • EN 134104 : 1995 ; Harmonized quality assessment system specification for electronic components. Blank detail feature: compression type trimer capacitors (qualification confirmation).
  • EN 137000: 1996; Compatible quality assessment system for electronic components. General characteristics : Fixed aluminum electrolytic ac capacitors with non-solid electrolyte for use with motors.
  • EN 137100: 1996; Compatible quality assessment system for electronic components. Section properties. Fixed aluminum electrolytic ac capacitors with non-solid electrolyte for motor starter applications. Qualification confirmation.
  • EN 137101: 1996; Compatible quality assessment system for electronic components. Empty detail property. Fixed aluminum electrolytic ac capacitors with non-solid electrolyte for motor starter applications (Qualification approval).
  • EN 138000: 1997; Compatible quality assessment system for electronic components. General specification : fixed inductors for electromagnetic interference suppression (inductors for which safety tests are required).
  • EN 138100: 1997; Compatible quality assessment system for electronic components. Sectional characteristics : fixed inductors for electromagnetic interference suppression (inductors for which safety tests are required).
  • EN 138101: 1997; Compatible quality assessment system for electronic components. Blank detail specification: fixed inductors for electromagnetic interference suppression (inductors for which safety tests are required). Evaluation level D.
  • EN 140000 : 1995 ; Compatible quality assessment system for electronic components. General features: fixed resistors.
  • EN 140100 : 2008 ; Section properties. Fixed low power film resistors.
  • EN 140101-806 : 2008+A1 : 2013 ; Detail Features : Fixed low power film resistors. Metal film resistors on high grade ceramic, conformally coated or molded, axial or preformed ends.
  • EN 140101: 1997; Compatible quality assessment system for electronic components. Blank detail specification: fixed low power radio wound resistors (rating level S).
  • EN 140101 : 2008 ; Blank Detail Specification. Fixed low power film resistors.
  • EN 140102: 1996; Compatible quality assessment system for electronic components. Blank detail feature: fixed low-power non-wire-wound resistors (rating level M).
  • EN 140103: 1996; Compatible quality assessment system for electronic components. Empty detail property. Fixed low-power non-wire-wound resistors (Rating level P).
  • EN 140104: 1996; Compatible quality assessment system for electronic components. Blank detail feature: fixed low power non-wire wound resistors (Rating levels SB and SC).
  • EN 140200: 1997; Compatible quality assessment system for electronic components. Section characteristics: constant power resistors.
  • EN 140201: 1997; Compatible quality assessment system for electronic components. Blank detail feature: constant power resistors (Rating level S).
  • EN 140202: 1997; Compatible quality assessment system for electronic components. Blank detail feature: constant power resistors (Rating level M).
  • EN 140203: 1997; Compatible quality assessment system for electronic components. Blank detail feature: constant power resistors (Rating level H).
  • EN 140210 : 1995 ; Compatible quality assessment system for electronic components. Section characteristics: constant power resistors. Ability confirmation.
  • EN 140211: 1995; Harmonized quality assessment system specification for electronic components. Blank detail feature: constant power resistors. Ability confirmation.
  • EN 140400 : 1997 ; Compatible quality assessment system for electronic components. Cross-sectional characteristics: fixed low power surface mount (SMD) resistors.
  • EN 140401-801 : 2007+A1 : 2013 ; Detail features: Fixed low power film SMD resistors. rectangle. Stability classes 0,1 ; 0,25 ; 0,5 ; one ;
  • EN 140401-802 : 2007+A2 : 2013 ; Detail specifications: Fixed low power film SMD resistors. rectangle. Stability classes 1 ; 2nd ;
  • EN 140401-803 : 2007+A2 : 2013 ; Detail features: Fixed low power film SMD resistors. Cylindrical. Stability classes 0,05 ; 0,1 ; 0,25 ; 0,5 ; one ; 1nd ;
  • EN 140401-804 : 2005 ; Detail specifications. Fixed low power, non-wire wound high stability surface mount (SMD) resistors. rectangle. Stability classes 0,1;0,25 ;
  • EN 140401-804 : 2011+A1 : 2013 ; Detail Specification: Fixed low power film high stability SMD resistors. rectangle. Stability classes 0,1 ; 0,25 ;
  • EN 140401: 1997; Compatible quality assessment system for electronic components. Empty detail property. Fixed low power, radio wound surface mount (SMD) resistors.
  • EN 140401: 2009; Blank Detail Specification. Fixed low power film surface mount (SMD) resistors.
  • EN 140402-801 : 2005 ; Detail specifications : Fixed low power wire wound surface mount (SMD) resistors. rectangle. Stability classes 0,5 ; one ; 1nd ;
  • EN 140402-801 : 2015 ; Detail specifications : Fixed low power wired surface mount (SMD) resistors. rectangle. Stability classes 0,5 ; one ; 1nd ;
  • EN 140402: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fixed low power wire-wound surface mount (SMD) resistors.
  • EN 140402: 2015; Blank Detail Specification : Fixed low power wire wound surface mount (SMD) resistors.
  • EN 141101 : 1992 ; Harmonized quality assessment system specification for electronic components. Empty detail property. Lead screw and preset rotary potentiometers.
  • EN 143000 : 1992 ; Harmonized quality assessment system for electronic components : general characteristics : directly heated negative temperature coefficient thermistors.
  • EN 143001 : 1992 ; Harmonized quality assessment system specification for electronic components. Empty detail feature: directly heated negative temperature coefficient thermistors (filled glass or glassy enamel beads).
  • EN 143002: 1992; Harmonized quality assessment system specification for electronic components. Empty detail feature: directly heated negative temperature coefficient thermistors (beads in envelopes).
  • EN 143003: 1992; Harmonized quality assessment system specification for electronic components. Empty detail feature: directly heated negative temperature coefficient thermistors (disc type).
  • EN 143004: 1992; Harmonized quality assessment system specification for electronic components. Empty detail feature: directly heated negative temperature coefficient thermistors (rod type).
  • EN 144000 : 1994 ; Compatible quality assessment system for electronic components. General characteristics: directly heated positive temperature coefficient thermistors, typically made from modified ferroelectric materials.
  • EN 144001 : 1995 ; Harmonized quality assessment system specification for electronic components. Blank detail feature: directly heated positive temperature coefficient thermistors primarily designed for current limitation.
  • EN 144002: 1995; Harmonized quality assessment system specification for electronic components. Blank detail feature: directly heated positive temperature coefficient thermistors designed primarily for the heating element.
  • EN 144003: 1995; Harmonized quality assessment system specification for electronic components. Empty detail feature: directly heated positive temperature coefficient thermistors primarily designed for inrush current.
  • EN 144004: 1995; Harmonized quality assessment system specification for electronic components. Blank detail feature: directly heated positive temperature coefficient thermistors designed primarily for temperature sensing.
  • EN 147000 : 1995 ; Compatible quality assessment system for electronic components. General specification. Sockets for use with electrical relays of rated quality.
  • EN 147100 : 1995 ; Compatible quality assessment system for electronic components. Cross-sectional characteristics: relay sockets of evaluated quality.
  • EN 147101: 1995; Harmonized quality assessment system specification for electronic components. Empty detail feature: relay sockets of evaluated quality.
  • EN 150001: 1993; Harmonized quality assessment system specification for electronic components. Blank detail feature: general purpose semiconductor diodes.
  • EN 150008 : 1993 ; Compatible quality assessment system for electronic components. Blank detail feature: ambient-grade rectifier diodes.
  • EN 150009 : 1993 ; Compatible quality assessment system for electronic components. Empty detail feature: state-grade rectifier diodes.
  • EN 150010 : 1993 ; Harmonized quality assessment system specification for electronic components. Null detail feature: ambient-grade thyristors.
  • EN 150011 : 1993 ; Harmonized quality assessment system specification for electronic components. Blank detail feature: case-grade thyristors.
  • EN 150013 : 1993 ; Harmonized quality assessment system specification for electronic components. Empty detail feature: current regulator and current reference diodes.
  • EN 150014: 1997; Compatible quality assessment system for electronic components. Empty detail feature: Thyristor diodes, transient overvoltage suppressors.
  • EN 150015 : 1993 ; Compatible quality assessment system for electronic components. Blank detail feature: unidirectional transient overvoltage suppressor diodes.
  • EN 153000: 1998; Compatible quality assessment system for electronic components. General specification : discrete pressure contact power semiconductor devices (qualification confirmation).
  • EN 160000 : 1993 ; Compatible quality assessment system for electronic components. General features: modular electronic units.
  • EN 160100: 1998; Compatible quality assessment system for electronic components. Cross-sectional specification: capability validation of manufacturers of printed carton assemblies of evaluated quality.
  • EN 160101: 1998; Compatible quality assessment system for electronic components. Blank detail feature: printed board assembly modular electronics units of evaluated quality. Ability confirmation.
  • EN 160200-1: 1998; Compatible quality assessment system for electronic components. Section properties. Evaluated quality microwave modular electronic units. Talent approval procedure
  • EN 160200-2: 1998; Compatible quality assessment system for electronic components. Section properties. Evaluated quality microwave modular electronic units. Test methods directory
  • EN 160201: 1998; Compatible quality assessment system for electronic components. Empty detail property. Evaluated quality microwave modular electronic units. Ability confirmation.
  • EN 165000-1: 1996; Film and hybrid integrated circuits. General specification. Talent approval procedure
  • EN 165000-2: 1996; Film and hybrid integrated circuits. Internal visual inspection and special tests
  • EN 165000-3: 1996; Film and hybrid integrated circuits. Self-audit checklist and report for film and hybrid integrated circuit manufacturers
  • EN 165000-4: 1996; Film and hybrid integrated circuits. Customer information, product evaluation level schedules, and blank detail specification
  • EN 165000-5: 1998; Film and hybrid integrated circuits. Qualification approval procedure
  • EN 166000: 1996; Compatible quality assessment system for electronic components. General specification. Surface acoustic wave (SAW) filters.
  • EN 166100: 1998; Compatible quality assessment system for electronic components. Section properties: surface acoustic wave (SAW) filters.
  • EN 166101 : 1999 ; Compatible quality assessment system for electronic components. Blank detail feature: surface acoustic wave (SAW) filters. Ability confirmation.
  • EN 167000 : 1993 ; Compatible quality assessment system for electronic components. General features: piezoelectric filters.
  • EN 167100: 1996; Compatible quality assessment system for electronic components. Part features : piezoelectric filters (Talent approval).
  • EN 167101: 1996; Compatible quality assessment system for electronic components. Empty detail feature : piezoelectric filters (Capability confirmation).
  • EN 168000: 1996; Compatible quality assessment system for electronic components. General properties: quartz crystal units.
  • EN 168100 : 1995 ; Compatible quality assessment system for electronic components. Section characteristics: quartz crystal units (ability confirmation).
  • EN 168101: 1997; Compatible quality assessment system for electronic components. Empty detail attribute : quartz crystal units (skill confirmation).
  • EN 168201: 1996; Compatible quality assessment system for electronic components. Empty detail property. Quartz crystal units. (Qualification confirmation).
  • EN 169000 : 1993 ; Compatible quality assessment system for electronic components. General specification. Quartz crystal controlled oscillators.
  • EN 169100 : 1993 ; Compatible quality assessment system for electronic components. Section characteristics : quartz crystal controlled oscillators (capability confirmation).
  • EN 169101 : 1995 ; Harmonized quality assessment system specification for electronic components. Empty detail feature : quartz crystal controlled oscillators (skill confirmation).
  • EN 169200 : 1996 ; Compatible quality assessment system for electronic components. Cross-sectional characteristics: Quartz crystal controlled oscillators (qualification confirmation).
  • EN 169201 : 1996 ; Compatible quality assessment system for electronic components. Empty detail property. Quartz crystal controlled oscillators (Qualification confirmation).
  • EN 170000 : 1999 ; Compatible quality assessment system for electronic components. General properties: waveguide type dielectric resonators.
  • EN 175100 : 1993 ; Compatible quality assessment system for electronic components. Section properties. Two-piece and edged socket connectors for printed board applications.
  • EN 175101-802: 2000; Compatible quality assessment system for electronic components. Detail specifications. Two-piece connectors for printed boards for a high number of contacts with a 3 mm basic grid on 4 or 2,54 rows
  • EN 175101-809: 2000; Compatible quality assessment system for electronic components. Detail specifications. Detail Specification : Two-piece connectors for printed cards with 2,54 mm grid, short version conforming to CECC 75101-801, with rated quality
  • EN 175200 : 1992 ; Harmonized system of quality assessment for electronic components : cross section characteristics : circular connectors.
  • EN 175200 : 1997 ; Compatible quality assessment system for electronic components. Section features: circular connectors.
  • EN 175201-804 : 2000 ; Compatible quality assessment system for electronic components. Detail specifications. circular connectors. Round contacts, diameter 1,6 mm, threaded coupling
  • EN 175300 : 1992 ; Compatible quality assessment system for electronic components. Cross-sectional characteristics: Rectangular connectors for frequencies below 3 MHz.
  • EN 175300 : 1997 ; Compatible quality assessment system for electronic components. Cross-sectional characteristics: Rectangular connectors for frequencies below 3 MHz.
  • EN 175301-801: 2000; Compatible quality assessment system for electronic components. Detail specifications. High density rectangular connectors, round removable crimping contacts
  • EN 175301-801: 2006; Detail specifications. High density rectangular connectors, round removable crimping contacts.
  • EN 175301-803: 2000; Compatible quality assessment system for electronic components. Detail specifications. rectangular connectors. Flat contacts, 0,8 mm thick, locking screw cannot be removed
  • EN 175301-803: 2006; Detail specifications: rectangular connectors. Flat contacts, 0,8 mm thickness, locking screw cannot be removed.
  • EN 180000: 1996; Compatible quality assessment system for electronic components. General features: Fiber optic attenuators.
  • EN 180101 : 1995 ; Harmonized quality assessment system specification for electronic components. Blank detail feature: fixed fiber optic attenuators.
  • EN 181000 : 1995 ; Compatible quality assessment system for electronic components. General specification. Fiber optic branching devices.
  • EN 181101 : 1995 ; Harmonized quality assessment system specification for electronic components. Blank detail feature: fiber optic branching devices. Type : selectively permeable star with no wavelength.
  • EN 181102 : 1995 ; Harmonized quality assessment system specification for electronic components. Blank detail feature: fiber optic branching devices. Type : wavelength selective transmission star.
  • EN 181103: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fiber optic branching devices. Type : non-wavelength selectively permeable star for telecommunications application.
  • EN 181104: 1998; Compatible quality assessment system for electronic components. Blank detail feature: fiber optic branching devices. Type : wavelength selective permeable star for telecommunications application.
  • EN 186000-1 : 1994 ; Compatible quality assessment system for electronic components. General specification. Connection sets for optical fibers and cables. Requirements, test methods and proficiency approval procedures
  • EN 186001 : 1994 ; Harmonized quality assessment system specification for electronic components. Empty detail property. Connectors for optical fibers and cables. Environmental category I.
  • EN 186002: 1994; Harmonized quality assessment system specification for electronic components. Empty detail property. Connector for optical fibers and cables. Environmental category II.
  • EN 186003: 1994; Harmonized quality assessment system specification for electronic components. Empty detail property. Connector for optical fibers and cables. Environmental category III.
  • EN 186004: 1994; Harmonized quality assessment system specification for electronic components. Empty detail property. Connector for optical fibers and cables. Environmental category IV.
  • EN 186005 : 1994 ; Harmonized quality assessment system specification for electronic components. Empty detail property. Connector for optical fibers and cables. Environmental category V.
  • EN 186006-1: 1996; Compatible quality assessment system for electronic components. Empty detail property. Connectors for optical fibers and cables for military use. Environmental category VI
  • EN 186100: 1995; Compatible quality assessment system for electronic components. Sectional specifications: connector sets for optical fibers and cables. F-SMA types.
  • EN 186110 : 1995 ; Compatible quality assessment system for electronic components. Sectional specifications: connector sets for optical fibers and cables. Type FC.
  • EN 186130: 1996; Compatible quality assessment system for electronic components. Section properties. Connection sets for optical fibers and cables. Type LSA.
  • EN 186150 : 1997 ; Connection sets for optical fibers and cables. Type OCCA-BU.
  • EN 186160: 1997; Connection sets for optical fibers and cables. Type OCCA-PC.
  • EN 186170: 1998; Compatible quality assessment system for electronic components. Sectional specifications: connector sets for optical fibers and cables. Type RCC.
  • EN 186180 : 1996 ; Compatible quality assessment system for electronic components. Section properties. Connection sets for optical fibers and cables. Type LSB.
  • EN 186210: 1996; Compatible quality assessment system for electronic components. Sectional specifications: connector sets for optical fibers and cables. Type CF08 ;
  • EN 186220: 1996; Compatible quality assessment system for electronic components. Section specifications: Connection sets for optical fibers and cables. Type LSC.
  • EN 186230: 1996; Compatible quality assessment system for electronic components. Sectional specifications: connector sets for optical fibers and cables. Type LSF.
  • EN 186240: 1996; Compatible quality assessment system for electronic components. Sectional specifications: connector sets for optical fibers and cables. Type MT.
  • EN 186260: 1998; Compatible quality assessment system for electronic components. Sectional specifications: connector sets for optical fibers and cables. Type SC.
  • EN 186270: 1998; Compatible quality assessment system for electronic components. Sectional specifications: connector sets for optical fibers and cables. Type LSH.
  • EN 186290: 1998; Compatible quality assessment system for electronic components. Connection sets for optical fibers and cables. Type MPO.
  • EN 186300 : 1999 ; Compatible quality assessment system for electronic components. Sectional specifications: connector sets for optical fibers and MSC type cables.
  • EN 186310 : 1999 ; Compatible quality assessment system for electronic components. Sectional specifications: connector sets for optical fibers and cables. Type MF.

Standards facilitate international trade by ensuring compatibility and interoperability of components, products and services. European Standards (ENs) are documents approved by three European Standardization Organizations (ESO), CEN, CENELEC or ETSI; Recognized as competent in the field of voluntary technical standardization for EU Regulation 1025/2012.

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